damage to components can take the form of upset failures or catastrophic
Upset failures - result in gate leakage
Catastrophic failures - occur in two forms, Direct and Latent
catastrophic failures occur when a component is damaged to the point where it
is DEAD NOW and it will never again function. This is the easiest type of ESD
damage to find since it usually can be detected during testing.
failures occur when ESD weakens or wounds the component to the point where it
will still function properly during testing, but over time the wounded
component will cause poor system performance and eventually complete system
failure. Because latent failures occur after final inspection or in the hands
of your customer, the cost for repair is very high. Not only is this type of
damage hard to find, but it severely affects the reputation of your company's
upset failure occurs when an electrostatic discharge has caused a current flow
that is not significant enough to cause total failure, but in use may
intermittently result in gate leakage causing loss of software or incorrect
storage of information.
or latent failures may pass your company's quality control testing program. In
other words, static damage may occur that cannot be felt, seen, or detected
through normal testing procedures.